TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF THIN-FILMS OF YBA2CU3O7-X

被引：2

作者：

CHENEVIER, B

DUBOURDIEU, C

SENATEUR, JP

THOMAS, O

机构：

[1] Laboratoire des Matériaux et du Génie Physique - E.N.S.P.G., C.N.R.S. URA 1109

来源：

PHYSICA C | 1994年 / 235卷

关键词：

D O I：

10.1016/0921-4534(94)91551-2

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The microstructure of thin films of YBa2Cu3O7_x deposited on MgO substrates by a Metal Organic Chemical Vapour Deposition method has been analysed by transmission electron microscopy. Films are highly textured with the unit cell c-axis of the film perpendicular to the surface. Some of the films contain a proportion of a-axis oriented grains. In films containing a high proportion of this type of grains, cross-sectional observations show that the insertion of the grains in the matrix is likely associated with a nucleation-growth process. Images also show the presence in the c-oriented matrix of stacking faults perpendicular to c and allow to analyse relaxation of the thin layer at the film/substrate interface.

引用

页码：655 / 656

页数：2