MICROSCOPIC IMAGING OF RESIDUAL-STRESS USING A SCANNING PHASE-MEASURING ACOUSTIC MICROSCOPE

被引：30

作者：

MEEKS, SW

PETER, D

HORNE, D

YOUNG, K

NOVOTNY, V

机构：

来源：

APPLIED PHYSICS LETTERS | 1989年 / 55卷 / 18期

关键词：

D O I：

10.1063/1.102326

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1835 / 1837

页数：3

共 13 条

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