DETERMINATION OF SILICON IN TITANIUM-DIOXIDE AND ZIRCONIUM DIOXIDE BY ELECTROTHERMAL ATOMIC-ABSORPTION SPECTROMETRY USING THE SLURRY SAMPLING TECHNIQUE

被引：24

作者：

HAUPTKORN, S ^{[1
]}

SCHNEIDER, G ^{[1
]}

KRIVAN, V ^{[1
]}

机构：

[1] UNIV ULM,SEKT ANALYT & HOCHSTREINIGUNG,ALBERT EINSTEIN ALLEE 11,D-89069 ULM,GERMANY

来源：

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 1994年 / 9卷 / 03期

关键词：

SILICON DETERMINATION; TITANIUM DIOXIDE; ZIRCONIUM DIOXIDE; SLURRY SAMPLING; ELECTROTHERMAL ATOMIC ABSORPTION SPECTROMETRY;

D O I：

10.1039/ja9940900463

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A method for the determination of silicon in titanium dioxide and zirconium dioxide powders based on electrothermal atomic absorption spectrometry using the slurry sampling technique has been developed. The experimental conditions with regard to chemical modification, the temperature programme, the lifetime of the graphite furnace and the slurry concentration were optimized. The behaviour of zirconium and calcium in the graphite tube during the ashing, atomization and cleaning steps was investigated using 47Ca and 97Zr as radiotracers. Calibration was performed by the standard additions method using aqueous standards. The results of this technique were compared with those for atomic emission spectrometry. The limits of detection were found to be 7 mug g-1 in titanium dioxide and 2 mug g-1 in zirconium dioxide, respectively.

引用

页码：463 / 468

页数：6

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