MEASUREMENT OF SURFACE-ROUGHNESS USING DICHROMATIC SPECKLE

被引:22
作者
FUJII, H [1 ]
LIT, JWY [1 ]
机构
[1] UNIV LAVAL,RECH OPT & LASER LAB,QUEBEC CITY 10,QUEBEC,CANADA
关键词
D O I
10.1016/0030-4018(77)90025-6
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:231 / 235
页数:5
相关论文
共 20 条
[1]  
Dainty J. C., 1975, LASER SPECKLE RELATE
[2]   MEASUREMENTS OF SURFACE-ROUGHNESS PROPERTIES BY MEANS OF LASER SPECKLE TECHNIQUES [J].
FUJII, H ;
ASAKURA, T ;
SHINDO, Y .
OPTICS COMMUNICATIONS, 1976, 16 (01) :68-72
[3]   DEVELOPMENT OF LASER SPECKLE AND ITS APPLICATION TO SURFACE INSPECTIONS [J].
FUJII, H ;
ASAKURA, T .
APPLIED OPTICS, 1977, 16 (01) :180-183
[4]   EFFECT OF SURFACE-ROUGHNESS ON STATISTICAL DISTRIBUTION OF IMAGE SPECKLE INTENSITY [J].
FUJII, H ;
ASAKURA, T .
OPTICS COMMUNICATIONS, 1974, 11 (01) :35-38
[5]  
Fujii H., 1976, J OPT SOC AM, V66
[6]   SPECKLE REDUCTION USING MULTIPLE TONES OF ILLUMINATION [J].
GEORGE, N ;
JAIN, A .
APPLIED OPTICS, 1973, 12 (06) :1202-1212
[7]   SPACE AND WAVELENGTH DEPENDENCE OF SPECKLE INTENSITY [J].
GEORGE, N ;
JAIN, A .
APPLIED PHYSICS, 1974, 4 (03) :201-212
[8]  
Goodman J. W., 1963, STAT PROPERTIES LASE
[9]  
GOODMAN JW, 1963, SEL63140 TR23031 STA
[10]   NON-GAUSSIAN FLUCTUATIONS IN ELECTROMAGNETIC RADIATION SCATTERED BY A RANDOM PHASE SCREEN .1. THEORY [J].
JAKEMAN, E ;
PUSEY, PN .
JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL, 1975, 8 (03) :369-391