MICROWAVE PENETRATION DEPTH MEASUREMENTS ON BI2SR2CACU2O8 SINGLE-CRYSTALS AND YBA2CU3O7-DELTA THIN-FILMS

被引:150
作者
MA, ZX
TABER, RC
LOMBARDO, LW
KAPITULNIK, A
BEASLEY, MR
MERCHANT, P
EOM, CB
HOU, SY
PHILLIPS, JM
机构
[1] HEWLETT PACKARD CORP, PALO ALTO, CA 94304 USA
[2] AT&T BELL LABS, MURRAY HILL, NJ 07974 USA
关键词
D O I
10.1103/PhysRevLett.71.781
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The temperature dependence of the magnetic penetration depth of Bi2Sr2CaCu2O8 single crystals and YBa2Cu3O7-delta thin films has been measured with a parallel plate resonator technique at microwave frequencies. Both materials show a T2 temperature dependence between 10 and 25 K, and systematic deviations towards a flatter temperature dependence below 10 K. We have also calculated the real part of the complex conductivity of YBa2Cu3O7-delta thin films from our penetration depth and surface resistance data and compare them with those of YBa2Cu3O7-delta single crystals.
引用
收藏
页码:781 / 784
页数:4
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