MEASUREMENT OF MICROGRAM SURFACE DENSITIES BY OBSERVATION OF PROTON PRODUCED X RAYS

被引：18

作者：

CHRISTENSEN, LJ

KHAN, JM

BRUNNER, WF

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1967年 / 38卷 / 01期

关键词：

D O I：

10.1063/1.1720519

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：20 / +

页数：1

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