USE OF MODULATED REFERENCE WAVE IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY

被引：78

作者：

LOKBERG, OJ ^{[1
]}

HOGMOEN, K ^{[1
]}

机构：

[1] UNIV TRONDHEIM,NORWEGIAN INST TECHNOL,DEPT PHYS,N-7034 TRONDHEIM,NORWAY

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1976年 / 9卷 / 10期

关键词：

D O I：

10.1088/0022-3735/9/10/020

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：847 / 851

页数：5

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