A PRACTICAL APPROACH TO THE PERIODIC CONTINUATION METHOD FOR THE SIMULATION OF HIGH-RESOLUTION TEM IMAGES OF ISOLATED CRYSTAL DEFECTS

被引：3

作者：

MATSUHATA, H

VANDYCK, D

VANLANDUYT, J

AMELINCKX, S

机构：

来源：

关键词：

D O I：

10.1016/0304-3991(84)90214-6

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：343 / 347

页数：5

相关论文

共 7 条

[1] COWLEY JM, 1975, DIFFRACTION PHYSICS, P239
[2] GRINTON GR, 1971, OPTIK, V34, P221
[3] MCLAGAN DS, 1977, PHIL MAG, V35, P757
[4] VANDYCK D, 1980, J MICROSC-OXFORD, V119, P141, DOI 10.1111/j.1365-2818.1980.tb04084.x
[5] VANDYCK D, UNPUB ULTRAMICROSCOP
[6] VANTENDELOO G, 1980, ELECTRON MICROS, V1, P226
[7] WILSON AR, 1982, PHILOS MAG A, V46, P435, DOI 10.1080/01418618208239570