NELDER AND MEAD ALGORITHM IN IMPEDANCE SPECTRA FITTING

被引:14
作者
DELLIS, JL
CARPENTIER, JL
机构
[1] Laboratoire des Matériaux Semi-conducteurs, Faculté des Sciences, 80039 Amiens
关键词
D O I
10.1016/0167-2738(93)90259-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A program allowing impedance simulation as well as data fitting in using the simplex method is described. The accuracy is demonstrated through the fit of computer generated and experimental data.
引用
收藏
页码:119 / 123
页数:5
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