RECENT IMPROVEMENTS TO THE CAMBRIDGE-UNIVERSITY 600-KV HIGH-RESOLUTION ELECTRON-MICROSCOPE

被引：27

作者：

SMITH, DJ ^{[1
]}

CAMPS, RA ^{[1
]}

FREEMAN, LA ^{[1
]}

HILL, R ^{[1
]}

NIXON, WC ^{[1
]}

SMITH, KCA ^{[1
]}

机构：

[1] UNIV CAMBRIDGE, DEPT ENGN, CAMBRIDGE CB2 1PZ, ENGLAND

来源：

JOURNAL OF MICROSCOPY | 1983年 / 130卷 / MAY期

关键词：

D O I：

10.1111/j.1365-2818.1983.tb04211.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：127 / 136

页数：10

共 24 条

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WOOD, GJ .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1978, 38 (06) :673-689

[3]

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[4]

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[5] THE HIGH-RESOLUTION ELECTRON-MICROSCOPY OF STACKING DEFECTS IN CU-ZN-AL SHAPE MEMORY ALLOY [J].

COOK, JM ;

OKEEFE, MA ;

SMITH, DJ ;

STOBBS, WM .

JOURNAL OF MICROSCOPY, 1983, 129 (MAR) :295-306

[6] PRINCIPLES AND PERFORMANCE OF A 600 KV HIGH-RESOLUTION ELECTRON-MICROSCOPE [J].

COSSLETT, VE .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1980, 370 (1740) :1-&

[7]

FRYER JR, 1982, ELECTRON MICROS, V2, P449

[8]

HILL R, 1982, INST PHYS CONF SER, P71

[9]

HIRABAYASHI M, 1980, ELECTRON MICROS, V4, P142

[10]

HORIUCHI S, 1978, J ELECTRON MICROSC, V27, P39

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