EXTREME UV SPECTROGRAPH ATM EXPERIMENT S082B/N

被引:116
作者
BARTOE, JDF [1 ]
BRUECKNER, GE [1 ]
PURCELL, JD [1 ]
TOUSEY, R [1 ]
机构
[1] USN,RES LAB,EO HULBURT CTR SPACE RES,WASHINGTON,DC 20375
来源
APPLIED OPTICS | 1977年 / 16卷 / 04期
关键词
D O I
10.1364/AO.16.000879
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:879 / 886
页数:8
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