NANOSTRUCTURE OF SM-CO ON CR THIN-FILMS

被引：25

作者：

LIU, Y

ROBERTSON, BW

SHAN, ZS

MALHOTRA, S

YU, MJ

RENUKUNTA, SK

LIOU, SH

SELLMYER, DJ

机构：

[1] UNIV NEBRASKA,DEPT MECH ENGN,LINCOLN,NE 68588

[2] UNIV NEBRASKA,BEHLEN LAB PHYS,LINCOLN,NE 68588

[3] UNIV NEBRASKA,DEPT ELECT ENGN,LINCOLN,NE 68588

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1994年 / 30卷 / 06期

关键词：

D O I：

10.1109/20.333981

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The nanostructures of Sm-Co on Cr thin films prepared by de magnetron sputtering were investigated by high resolution transmission electron microscopy (HRTEM) and diffraction techniques, HRTEM micrographs show that the crystallites in the Sm-Co films, as revealed by the lattice fringes, are distributed discontinuously in the matrix. The matrix is amorphous as indicated by microdiffraction study. The size of the crystallites is in the range of 2 similar to 5 nanometers. The volume fraction of the crystallites in the film decreases from 91% to 54% as the argon pressure is increased from 5 mTorr to 30 mTorr, Micrographs recorded in bright field transmission electron microscope (TEM) with a defocus of a few micrometers reveal grain-like structures of about 25 nm in some but dot all films. This grain-structure is found to be inherited from the Cr underlayer.

引用

页码：4035 / 4037

页数：3