CALCULATION OF MICROSTRIP DISCONTINUITY INDUCTANCES

被引：74

作者：

THOMSON, AF ^{[1
]}

GOPINATH, A ^{[1
]}

机构：

[1] UNIV COLL N WALES,SCH ELECT & ENGN SCI,BANGOR LL57 1UT,CAERNARVONSHIRE,WALES

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1975年 / 23卷 / 08期

关键词：

D O I：

10.1109/TMTT.1975.1128643

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：648 / 655

页数：8

共 12 条

[1] EQUIVALENT CIRCUIT OF SOME MICROSTRIP DISCONTINUITIES [J].

EASTER, B .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1975, 23 (08) :655-660

[2] COMPUTATION OF LUMPED MICROSTRIP CAPACITIES BY MATRIX METHODS - RECTANGULAR SECTIONS AND END EFFECT [J].

FARRAR, A ;

ADAMS, AT .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1971, MT19 (05) :495-&

[3] MATRIX-METHODS FOR MICROSTRIP 3-DIMENSIONAL PROBLEMS [J].

FARRAR, A ;

ADAMS, AT .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1972, MT20 (08) :497-&

[4] CALCULATION OF INDUCTANCE OF FINITE-LENGTH STRIPS AND ITS VARIATION WITH FREQUENCY [J].

GOPINATH, A ;

SILVESTER, P .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1973, MT21 (06) :380-386

[5] MOMENT METHOD OF CALCULATING DISCONTINUITY INDUCTANCE OF MICROSTRIP RIGHT-ANGLED BENDS [J].

GOPINATH, A ;

EASTER, B .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1974, MT22 (10) :880-883

[6] ELECTRICAL CHARACTERIZATION OF A RIGHT-ANGLED BEND IN MICROSTRIP LINE [J].

HORTON, R .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1973, MT21 (06) :427-429

[7] EQUIVALENT REPRESENTATION OF AN ABRUPT IMPEDANCE STEP IN MICROSTRIP LINE [J].

HORTON, R .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1973, MT21 (08) :562-564

[8] MICROSTRIP END EFFECTS [J].

JAMES, DS ;

TSE, SH .

ELECTRONICS LETTERS, 1972, 8 (02) :46-&

[9] EQUIVALENT CAPACITANCES OF MICROSTRIP OPEN CIRCUITS [J].

SILVESTER, P ;

BENEDEK, P .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1972, MT20 (08) :511-+

[10] TEM WAVE PROPERTIES OF MICROSTRIP TRANSMISSION LINES [J].

SILVESTER, P .

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1968, 115 (01) :43-+

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