TECHNOLOGICAL IMPLICATIONS IN STUDIES OF NICKEL ELECTRODE PERFORMANCE AND DEGRADATION

被引:20
作者
ZIMMERMAN, AH
机构
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D O I
10.1016/0378-7753(84)80022-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:233 / 245
页数:13
相关论文
共 22 条
[1]   CAUSE OF RESIDUAL CAPACITY IN NICKEL OXYHYDROXIDE ELECTRODES [J].
BARNARD, R ;
CRICKMORE, GT ;
LEE, JA ;
TYE, FL .
JOURNAL OF APPLIED ELECTROCHEMISTRY, 1980, 10 (01) :61-70
[2]  
BARNARD R, 1981, POWER SOURCES, V8, P401
[3]  
BARNARD R, 1983, J APPL ELECTROCHEM, V12, P97
[4]  
BEAUCHAMP RL, 1972, Patent No. 3653967
[5]   THE ELECTROCHEMICAL BEHAVIOR OF THE NICKEL-NICKEL OXIDE ELECTRODE .1. KINETICS OF SELF-DISCHARGE [J].
CONWAY, BE ;
BOURGAULT, PL .
CANADIAN JOURNAL OF CHEMISTRY-REVUE CANADIENNE DE CHIMIE, 1959, 37 (01) :292-307
[6]  
FALK SU, 1969, ALKALINE STORAGE BAT, P126
[8]  
JANUSZKIEWICZ S, 1959, P ANNU POWER SOURCES, V13, P75
[9]  
KAPUR VK, 1980, OCT EL SOC C, P421
[10]  
KELSON P, 1973, POWER SOURCES, V4, P201