2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY

被引：374

作者：

CHENG, YY

WYANT, JC

机构：

来源：

关键词：

D O I：

10.1364/AO.23.004539

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：4539 / 4543

页数：5

共 6 条

[1] Bruning J.H., 1978, OPTICAL SHOP TESTING
[2] MULTIPLE-WAVELENGTH AND MULTIPLE-SOURCE HOLOGRAPHY APPLIED TO CONTOUR GENERATION
HILDEBRAND, BP
HAINES, KA
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (02) : 155 - +
[3] KOLIOPOULOS C, 1981, THESIS U ARIZONA
[4] 2-WAVELENGTH INTERFEROMETRY
POLHEMUS, C
[J]. APPLIED OPTICS, 1973, 12 (09): : 2071 - 2074
[5] DIGITAL WAVE-FRONT MEASURING INTERFEROMETRY - SOME SYSTEMATIC-ERROR SOURCES
SCHWIDER, J
BUROW, R
ELSSNER, KE
GRZANNA, J
SPOLACZYK, R
MERKEL, K
[J]. APPLIED OPTICS, 1983, 22 (21) : 3421 - 3432
[6] TESTING ASPHERICS USING WAVELENGTH HOLOGRAPHY
WYANT, JC
[J]. APPLIED OPTICS, 1971, 10 (09): : 2113 - &