FULL-FIELD MODELING OF THE LONGITUDINAL ELECTROOPTIC PROBE

被引：6

作者：

FREEMAN, JL

JEFFERIES, SR

AULD, BA

机构：

来源：

OPTICS LETTERS | 1987年 / 12卷 / 10期

关键词：

D O I：

10.1364/OL.12.000795

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：795 / 797

页数：3

共 20 条

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[2]

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[4]

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[6] ELECTROOPTIC SAMPLING IN GAAS INTEGRATED-CIRCUITS [J].

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BLOOM, DM .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1986, 22 (01) :79-93

[7] DIRECT ELECTRO-OPTIC SAMPLING OF TRANSMISSION-LINE SIGNALS PROPAGATING ON A GAAS SUBSTRATE [J].

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BLOOM, DM .

ELECTRONICS LETTERS, 1984, 20 (20) :818-819

[8]

LAX B, 1962, MICROWAVE FERRITES F, P537

[9]

MONTEATH GD, 1973, APPLICATIONS ELECTRO, P57

[10] INTERNAL MICROWAVE PROPAGATION AND DISTORTION CHARACTERISTICS OF TRAVELING-WAVE AMPLIFIERS STUDIED BY ELECTROOPTIC SAMPLING [J].

RODWELL, MJW ;

RIAZIAT, M ;

WEINGARTEN, KJ ;

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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1986, 34 (12) :1356-1362

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