ELEMENTAL IMAGING AND RESOLUTION IN ENERGY-FILTERED CONVENTIONAL ELECTRON-MICROSCOPY

被引：65

作者：

SHUMAN, H

CHANG, CF

SOMLYO, AP

机构：

来源：

ULTRAMICROSCOPY | 1986年 / 19卷 / 02期

关键词：

D O I：

10.1016/0304-3991(86)90201-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：121 / 133

页数：13

共 32 条

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[3]

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[9] QUANTITATIVE-ANALYSIS OF IMAGE-CONTRAST IN ELECTRON-MICROGRAPHS OF BEAM-SENSITIVE CRYSTALS [J].

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