A GENERIC APPROACH FOR PERMITTIVITY MEASUREMENT OF DIELECTRIC MATERIALS USING A DISCONTINUITY IN A RECTANGULAR WAVE-GUIDE OR A MICROSTRIP LINE

A generic approach is proposed to accurately measure microwave and millimeter-wave properties of dielectric materials. This novel technique first determines the scattering parameters of a discontinuity containing a material having a wide range of complex dielectric permittivity epsilon that is known a priori (the direct problem), The discontinuity is embedded in a rectangular waveguide or microstrip line, A unified theory, which is essentially based on a combination of the boundary integral equation technique with a modal expansion approach, is presented to tackle the direct problem, A class of generic diagrams are obtained for interrelating the dielectric permittivity epsilon to its S-parameters, and a simple analytical expression is deduced to solve the inverse problem. The proposed analytical formulation is easy to use and much more rapid than its iterative counterparts, It demonstrates a completely new and efficient strategy for accurate complex dielectric measurements.