X-RAY-POWDER DIFFRACTION FROM CARBON NANOTUBES AND NANOPARTICLES

被引：135

作者：

REZNIK, D ^{[1
]}

OLK, CH ^{[1
]}

NEUMANN, DA ^{[1
]}

COPLEY, JRD ^{[1
]}

机构：

[1] GM CORP,CTR RES & DEV,DEPT PHYS,WARREN,MI 48090

来源：

PHYSICAL REVIEW B | 1995年 / 52卷 / 01期

关键词：

D O I：

10.1103/PhysRevB.52.116

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report detailed x-ray powder-diffraction measurements on a sample consisting of 60% carbon nanotubes and 40% carbon nanoparticles. These measurements demonstrate the existence of short-range interlayer stacking correlations. Our calculations show that such correlations should not be observable in idealized models of nanotubes. The observation of short-range interlayer correlations can be explained if many of the nanotubes and nanoparticles have polygonal cross sections, largely consisting of flat regions having graphitic interlayer correlations. This polygonization is almost certainly driven by the van der Waals interactions responsible for the ABAB stacking in crystalline graphite. © 1995 The American Physical Society.

引用

页码：116 / 124

页数：9

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