H PASSIVATION OF SI IMPURITIES IN GAAS

被引:36
作者
PAVESI, L
GIANNOZZI, P
机构
[1] ECOLE POLYTECH FED LAUSANNE,PHB ECUBLENS,INST MICRO & OPTOELECTR,CH-1015 LAUSANNE,SWITZERLAND
[2] PHB ECUBLENS,INST ROMAND RECH NUMER PHYS MAT,CH-1015 LAUSANNE,SWITZERLAND
来源
PHYSICAL REVIEW B | 1991年 / 43卷 / 03期
关键词
D O I
10.1103/PhysRevB.43.2446
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The equilibrium sites, vibrational frequencies, and electronic properties of interstitial H in GaAs doped with Si have been studied by first-principles calculations in the local density approximation within a supercell approach. Two different Si sites in GaAs have been examined: Si replacing a Ga atom (Si(Ga) donor) and Si replacing an As atom (Si(As) acceptor). We find that the stable configuration for the H-Si(Ga) complex is the antibonding-Si site. The lattice undergoes a large relaxation and the Si-As bond is almost broken. The stable site for the H-Si(As) complex is along the Si(As)-Ga bond. H binds to the Si and Ga atoms forming a three-center bond. In both cases the lattice relaxation is essential in order to obtain the passivation of the impurities. The computed localized vibrational frequencies and dissociation energies of the H-Si complexes agree reasonably well with experimental results.
引用
收藏
页码:2446 / 2449
页数:4
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