ON THE POSSIBILITY OF MULTIPLE INCREASE OF THE RESOLUTION OF LAYER-BY-LAYER ANALYSIS OF MATERIALS

被引:2
作者
CHUMAKOV, AI
SMIRNOV, GV
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1986年 / 98卷 / 02期
关键词
D O I
10.1002/pssa.2210980202
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:339 / 343
页数:5
相关论文
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CHUMAKOV AI, 1984, FIZ TVERD TELA+, V26, P746
[2]  
LILJEQUIST D, 1979, ELECTRON PENETRATION, P34
[3]   A NEW SYSTEM FOR DEPTH-SELECTIVE CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY [J].
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DEWAARD, H ;
PETERSEN, JLW ;
VANDERWIJK, A ;
VANKLINKEN, J .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 221 (03) :577-581