MEASUREMENT OF J/V CHARACTERISTICS OF A GAAS SUB-MICRON N+-N--N+ DIODE

被引：17

作者：

HOLLIS, MA

EASTMAN, LF

WOOD, CEC

机构：

来源：

ELECTRONICS LETTERS | 1982年 / 18卷 / 13期

关键词：

D O I：

10.1049/el:19820386

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：570 / 572

页数：3

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