THERMAL-DIFFUSIVITY IN THIN-FILMS MEASURED BY NONCONTACT SINGLE-ENDED PULSED-LASER-INDUCED THERMAL RADIOMETRY

被引：45

作者：

LEUNG, WP ^{[1
]}

TAM, AC ^{[1
]}

机构：

[1] IBM CORP, RES LAB, SAN JOSE, CA 95193 USA

来源：

OPTICS LETTERS | 1984年 / 9卷 / 03期

关键词：

D O I：

10.1364/OL.9.000093

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：93 / 95

页数：3

共 17 条

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