FERROELECTRIC SWITCHING, MEMORY RETENTION AND ENDURANCE PROPERTIES OF VERY THIN PZT FILMS

被引:22
作者
MADERIC, BP
SANCHEZ, LE
WU, SY
机构
[1] McDonnell Douglas Electronic Systems Company, Huntington Beach
关键词
D O I
10.1080/00150199108007930
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Successful ferroelectric polarization and domain switching have been demonstrated in thin leadzirconatetitanate (PZT) films, less than 500Å, prepared by the sol-gel technique.1- In this paper, the ferroelectric switching, memory retention and endurance properties of these thin films, ranging in thickness from 425Å to 1500Å with a Zr/Ti ratio of 50/50, were investigated. A remanent polarization of 27 μC/cm2 was observed on a 650Å thick capacitor with a saturation voltage of 3 volts. A switching speed of 10.8 ns was measured for a 600Å thick, 25 x 25 |lm capacitor. A 1000Å thick, 100 x 100 μm capacitor showed no data loss after 1650 hours of memory retention. The projected life for both 1000° and 650° thick, 40 x 40 p.m capacitors is estimated to be longer than 1 x 1010 switching endurance cycles. Detailed measurements and experimental results will be described. © 1991, Taylor & Francis Group, LLC. All rights reserved.
引用
收藏
页码:65 / 77
页数:13
相关论文
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