NEAR-SURFACE STOICHIOMETRY OF HIGH-TEMPERATURE SUPERCONDUCTING YBACUO THIN-FILMS

被引:4
作者
DREHMAN, AJ [1 ]
DUMAIS, MW [1 ]
HORRIGAN, JA [1 ]
WANG, GC [1 ]
LIEW, YF [1 ]
机构
[1] RENSSELAER POLYTECH INST,DEPT PHYS,TROY,NY 12180
关键词
D O I
10.1557/JMR.1990.1392
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The surface morphology and near-surface chemical composition of high temperature superconducting Y–Ba–Cu–O thin films have been studied by Scanning Electron Microscopy (SEM) and Auger Electron Spectroscopy (AES) depth profiling. These films were fabricated on SrTiO3substrates by RF diode sputter deposition and subsequent furnace annealing in oxygen. The chemical composition at and near the surface of thin films was found to differ from the bulk composition. At about 500 A below the surface the Y, Ba, and Cu stoichiometry, as determined by AES, gradually approach that of the film interior. These results suggest that, for furnace annealed films, there may exist a minimum deposited Y–Ba–Cu–O film thickness in which superconductivity is possible. It was also found that the calculated copper concentration determined by AES during depth profiling is significantly lower than its actual value. © 1990, Materials Research Society. All rights reserved.
引用
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页码:1392 / 1396
页数:5
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