THE LINEWIDTH OF A MODE-LOCKED SEMICONDUCTOR-LASER CAUSED BY SPONTANEOUS EMISSION - EXPERIMENTAL COMPARISON TO SINGLE-MODE OPERATION

被引：22

作者：

RUSH, DW ^{[1
]}

BURDGE, GL ^{[1
]}

HO, PT ^{[1
]}

机构：

[1] LAB PHYS SCI, COLLEGE PK, MD 20740 USA

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1986年 / 22卷 / 11期

关键词：

D O I：

10.1109/JQE.1986.1072907

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2088 / 2091

页数：4

共 17 条

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