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A LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE FOR USE IN HIGH MAGNETIC-FIELDS

被引：12
作者：
DUBOIS, JGA
GERRITSEN, JW
HERMSEN, JGH
VANKEMPEN, H
机构：
[1] Research Institute for Materials, University of Nijmegen, Toernooiveld
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 08期
关键词：
D O I：
10.1063/1.1146492
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We describe the design and performance of a low temperature (1.3-4.2 K) scanning tunneling microscope (STM) setup that can be used in magnetic fields up to 9.5 T. Due to the compact, rigid, and concentric design, the STM is very insensitive to external vibrations. The influence of external magnetic fields on the performance of the STM has been minimized by making a version completely out of titanium (instead of stainless steel). The STM routinely shows atomic resolution on various samples over the whole magnetic field range. We demonstrate the spectroscopic capability by local spectroscopy of the Abrikosov flux lattice on NbSe2. (C) 1995 American Institute of Physics.
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页码：4146 / 4149
页数：4
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