ELECTRON-MICROSCOPY OF LEAF SURFACE OF DIFFERENT FORAGE PLANTS

被引:4
作者
WINSTEL, R [1 ]
RENTSCHLER, I [1 ]
机构
[1] UNIV HOHENHEIM, INST PHYS & METEOROL, GARBEN STR 30, D-7000 STUTTGART, GERMANY
关键词
D O I
10.1016/0047-7206(75)90002-3
中图分类号
TH742 [显微镜];
学科分类号
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页码:1 / 9
页数:9
相关论文
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