FIELD-ION MICROSCOPE ATOM PROBE STUDIES OF METALLIC GLASSES

[1] ARISE T, 1980, 27TH P INT FIELD EM, P399

[2] DEHOSSON JTM, 1982, FAL P M SOC AIME ST, P147

[3] FINNEY JL, 1984, 5TH INT C RAP QUENCH

[4] MECHANICAL-PROPERTIES OF FE-SI-B AMORPHOUS WIRES PRODUCED BY IN-ROTATING-WATER SPINNING METHOD [J]. METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1982, 13 (03): : 373 - 382

[5] POST-IONIZATION OF FIELD-EVAPORATED IONS [J]. PHYSICAL REVIEW LETTERS, 1980, 44 (23) : 1520 - 1523

[6] TRIPLET CORRELATION IN METALLIC GLASSES - FIELD-ION MICROSCOPY STUDY [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1980, 41 (01): : 11 - 20

[7] A HIGH-RESOLUTION FIELD-ION MICROSCOPIC STUDY OF FE40NI40B20 METALLIC-GLASS IMAGED AT LIQUID-HYDROGEN TEMPERATURE [J]. SOLID STATE COMMUNICATIONS, 1984, 50 (09) : 817 - 819

[8] LAMPARTER P, 1982, 4TH P INT C RAP QUEN, V1, P343

[9] Miller M. K., 1979, Surface and Interface Analysis, V1, P149, DOI 10.1002/sia.740010504

[10] AN ATOM PROBE STUDY OF THE ANOMALOUS FIELD EVAPORATION OF ALLOYS CONTAINING SILICON [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (01): : 57 - 62

[1] ARISE T, 1980, 27TH P INT FIELD EM, P399

[2] DEHOSSON JTM, 1982, FAL P M SOC AIME ST, P147

[3] FINNEY JL, 1984, 5TH INT C RAP QUENCH

[4] MECHANICAL-PROPERTIES OF FE-SI-B AMORPHOUS WIRES PRODUCED BY IN-ROTATING-WATER SPINNING METHOD [J]. METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1982, 13 (03): : 373 - 382

[5] POST-IONIZATION OF FIELD-EVAPORATED IONS [J]. PHYSICAL REVIEW LETTERS, 1980, 44 (23) : 1520 - 1523

[6] TRIPLET CORRELATION IN METALLIC GLASSES - FIELD-ION MICROSCOPY STUDY [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1980, 41 (01): : 11 - 20

[7] A HIGH-RESOLUTION FIELD-ION MICROSCOPIC STUDY OF FE40NI40B20 METALLIC-GLASS IMAGED AT LIQUID-HYDROGEN TEMPERATURE [J]. SOLID STATE COMMUNICATIONS, 1984, 50 (09) : 817 - 819

[8] LAMPARTER P, 1982, 4TH P INT C RAP QUEN, V1, P343

[9] Miller M. K., 1979, Surface and Interface Analysis, V1, P149, DOI 10.1002/sia.740010504

[10] AN ATOM PROBE STUDY OF THE ANOMALOUS FIELD EVAPORATION OF ALLOYS CONTAINING SILICON [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (01): : 57 - 62