A MODEL FOR EDGE SPECTRAL-LINE EMISSION AND APPLICATION TO ION TEMPERATURE-MEASUREMENTS WITH CHARGE-EXCHANGE RECOMBINATION SPECTROSCOPY

被引：9

作者：

SYNAKOWSKI, EJ

BELL, RE

BUSH, CE

机构：

[1] Princeton Plasma Physics Laboratory, Princeton

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 01期

关键词：

D O I：

10.1063/1.1146316

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A model for characterizing the cold edge component of spectra measured in charge-exchange recombination spectroscopy (CHERS) applications is presented. It provides a rapid means of constraining the amplitude and width of the cold component of spectra for which the characteristics of the hot charge-exchange emission are desired. The model utilizes the CHERS measurements themselves and measurements of the electron density near the radius of peak background emissivity. A comparison of model predictions with direct measurements of the background emission during neutral beam injection is presented. Influences of changes in background emission on the inferred ion temperature during a neutral beam pulse are discussed. © 1995 American Institute of Physics.

引用

页码：649 / 651

页数：3

共 7 条

[1]

CLARK R, COMMUNICATION

[2] DETERMINATION OF PLASMA-ION VELOCITY DISTRIBUTION VIA CHARGE-EXCHANGE RECOMBINATION SPECTROSCOPY [J].