EXCESS AND THERMAL CURRENTS IN GALLIUM ARSENIDE ESAKI DIODES

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SHIBATA, A
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10.1143/JJAP.3.711
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O59 [应用物理学];
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页码:711 / &
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[11]   THOMAS-FERMI APPROACH TO IMPURE SEMICONDUCTOR BAND STRUCTURE [J].
KANE, EO .
PHYSICAL REVIEW, 1963, 131 (01) :79-&
[12]  
KELDYSH LV, 1963, SOV PHYS-SOL STATE, V5, P1026
[13]   ELECTRON BOMBARDMENT DAMAGE IN SILICON ESAKI DIODES [J].
LOGAN, RA ;
GILBERT, JF ;
AUGUSTYNIAK, WM .
JOURNAL OF APPLIED PHYSICS, 1961, 32 (07) :1201-&
[14]   DEGENERATE GERMANIUM .1. TUNNEL, EXCESS, AND THERMAL CURRENT IN TUNNEL DIODES [J].
MEYERHOFER, D ;
BROWN, GA ;
SOMMERS, HS .
PHYSICAL REVIEW, 1962, 126 (04) :1329-&
[15]   THEORETICAL AND EXPERIMENTAL ANALYSIS OF GERMANIUM TUNNEL DIODE CHARACTERISTICS [J].
MINTON, RM ;
GLICKSMAN, R .
SOLID-STATE ELECTRONICS, 1964, 7 (07) :491-500
[16]  
NANAVATI RP, 1963, INTRODUCTION SEMICON, P373
[17]   PROPERTIES OF GAAS ALLOY DIODES [J].
REDIKER, RH ;
QUIST, TM .
SOLID-STATE ELECTRONICS, 1963, 6 (06) :657-665
[18]   EFFECTS OF ELECTRONS AND HOLES ON TRANSITION LAYER CHARACTERISTICS OF LINEARLY GRADED P-N JUNCTIONS [J].
SAH, CT .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1961, 49 (03) :603-&
[19]   ELECTRONIC PROCESSES AND EXCESS CURRENTS IN GOLD-DOPED NARROW LILICON JUNCTIONS [J].
SAH, CT .
PHYSICAL REVIEW, 1961, 123 (05) :1594-&
[20]  
SHIBATA A, TO BE PUBLISHED