IMAGING TECHNIQUE IN TRANSMISSION ELECTRON-MICROSCOPY UTILIZING DIFFRACTION FINE-STRUCTURE

被引：2

作者：

ALLEN, CW

OKAMOTO, PR

机构：

[1] UNIV NOTRE DAME,DEPT MET ENGN & MAT SCI,NOTRE DAME,IN 46556

[2] ARGONNE NATL LAB,DIV MAT SCI,ARGONNE,IL 60439

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1976年 / 36卷 / 01期

关键词：

D O I：

10.1002/pssa.2210360111

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：107 / 116

页数：10

共 12 条

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[2] FINE STRUCTURE OF SPOTS IN ELECTRON DIFFRACTION RESULTING FROM PRESENCE OF PLANAR INTERFACES AND DISLOCATIONS .V. MULTIPLE BEAM CASE [J].

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[3] FINE STRUCTURE OF WEAK KINEMATICAL ELECTRON DIFFRACTION BEAMS FOR A FOIL CONTAINING STACKING FAULT OR ANTI-PHASE BOUNDARIES - 2-BEAM CASE [J].

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AMELINCKX, S .

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GEVERS R, 1967, PHYS STATUS SOLIDI, V21, P393

[5] FINE STRUCTURE OF SPOTS IN ELECTRON DIFFRACTIOG FROM PRESENCE OF PLANAR INTERFACES AND DISLOCATIONS .3. DOMAIN BOUNDARIES [J].

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AMELINCK.S .

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[6]

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[7]

RIDDER RD, 1970, PHYS STATUS SOLIDI, V40, P271

[8]

RIDDER RD, 1970, PHYS STATUS SOLIDI, V42, P645

[9] FINE STRUCTURE OF BEAMS IN ELECTRON DIFFRACTION EMERGING FROM WEDGE-SHAPED CRYSTALS [J].

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[10]

VANLANDUYT J, 1966, PHYS STATUS SOLIDI, V18, P363, DOI 10.1002/pssb.19660180135

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