THE STUDY OF CHARGE CARRIER KINETICS IN SEMICONDUCTORS BY MICROWAVE CONDUCTIVITY MEASUREMENTS .2.

被引：103

作者：

KUNST, M

BECK, G

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 63卷 / 04期

关键词：

D O I：

10.1063/1.340013

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1093 / 1098

页数：6

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