Monolithic integration of a monitoring detector with an optical amplifier simplifies the use of an amplifier in lightwave systems. We describe the structure and performance of a monolithically integrated semiconductor optical amplifier with low-loss Y-branching waveguides and a monitoring p-i-n detector. The photocurrent of the integrated detector can be used as a single control parameter for amplifier output leveling, gain optimization, and in situ monitoring of facet antireflective coatings.