ULTRATRACE ANALYSIS BY SYNCHROTRON RADIATION

被引：9

作者：

GOHSHI, Y

机构：

[1] Department of Industrial Chemistry, The University of Tokyo, Hongo, Tokyo, Bunkyo

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1991年 / 303卷 / 03期

关键词：

D O I：

10.1016/0168-9002(91)90291-W

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Application of synchrotron radiation excitation to X-ray spectrochemical analysis is discussed. Improvements in sensitivity, nondestructiveness and selectivity are shown for X-ray fluorescence analysis based on various features of a synchrotron radiation light source. Imaging and chemical specification capabilities are explained together with future possibilities by X-ray microbeam analysis.

引用

页码：544 / 551

页数：8

共 7 条

[1]

GOHSHI Y, 1986, SHINKUROTORON HOUSHA, pCH9

[2]

IIDA A, IN PRESS HDB SYNCHRO, V4

[3] TRACE-ELEMENT DETERMINATIONS WITH SYNCHROTRON-INDUCED X-RAY-EMISSION [J].