TEMPERATURE INDUCED VALENCE TRANSITION IN (YBXIN1-X)CU2(X=0.35, 0.50, 0.55)

被引:23
作者
MULLER, H [1 ]
BAUER, E [1 ]
GRATZ, E [1 ]
YOSHIMURA, K [1 ]
NITTA, T [1 ]
MEKATA, M [1 ]
机构
[1] FUKUI UNIV,DEPT APPL PHYS,FUKUI 910,JAPAN
关键词
Electric Conductivity - Magnetic Properties - X-Rays--Diffraction;
D O I
10.1016/0304-8853(88)90350-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The temperature induced valence transition of Yb in the pseudobinary (YbxIn1-x)Cu2 series is studied by means of dc susceptibility, electrical resistivity, thermal expansion and low temperature X-ray diffraction. All these experiments exhibit that this transition from the Yb3+ state to an intermediate valence state takes place around 40 K within a few degrees. The samples were prepared in an argon-furnace followed by a heat treatment at 800°C over one week. The cubic Laves phase structure was found for all these concentrations.
引用
收藏
页码:159 / 160
页数:2
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