STM AFM STUDY OF GRAIN-BOUNDARY MIGRATION IN NANOSTRUCTURED SOLIDS

被引：29

作者：

YING, JY

WANG, GH

FUCHS, H

LASCHINSKI, R

GLEITER, H

机构：

[1] MIT,DEPT CHEM ENGN,CAMBRIDGE,MA 02139

[2] BASF AG,POLYMER RES LAB,W-6700 LUDWIGSHAFEN,GERMANY

[3] NANJING UNIV,DEPT PHYS,NANJING,PEOPLES R CHINA

[4] NANJING UNIV,INST SOLID STATE PHYS,NANJING,PEOPLES R CHINA

[5] INST NEUE MAT,W-6600 SAARBRUCKEN,GERMANY

来源：

MATERIALS LETTERS | 1992年 / 15卷 / 03期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0167-577X(92)90141-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Nanostructured materials were directly imaged by scanning tunneling microscopy (STM) and atomic force microscopy (AFM) . Images suggested that nanostructured palladium (Pd) consisted of equiaxed crystals of almost-equal-to 10 nm diameter joined together by grain boundaries. Migration of the grain boundaries in nanostructured Pd was stimulated by STM (but not AFM), resulting in a preferential alignment of the nanometer-sized grains.

引用

页码：180 / 185

页数：6

共 27 条

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