SIMPLE X-RAY-FLUORESCENCE METHOD FOR DETERMINING COMPOSITION OF PBXSN1-XTE PSEUDOBINARY ALLOYS

被引：4

作者：

FANO, V ^{[1
]}

GHEZZI, C ^{[1
]}

ZANOTTI, L ^{[1
]}

机构：

[1] CNR,MASPEC LAB,PARMA,ITALY

来源：

关键词：

D O I：

10.1366/000370276774457254

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：359 / 361

页数：3

共 9 条

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CHENG, KL
[J]. ANALYTICA CHIMICA ACTA, 1968, 42 (02) : 189 - &
[3] DETERMINATION OF LEAD, TIN, TELLURIUM, AND SOME DOPING ELEMENTS IN PBXSN1-XTE
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ZANOTTI, L
[J]. MICROCHEMICAL JOURNAL, 1973, 18 (01) : 1 - 7
[4] GIBALO IM, 1973, J ANAL CHEM-USSR+, V28, P2056
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[7] SOKOLOV VV, 1967, VESTN MOSK U, V22, P50
[8] COMPOSITION DETERMINATION OF ALXGA1-XP ALLOYS USING DIFFRACTED X-RAY INTENSITIES
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[J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (11) : 5109 - 5111
[9] WAGNER JW, 1967, MATERIALS RES B, V2, P1053