MATCHING IMAGES TO MODELS FOR REGISTRATION AND OBJECT DETECTION VIA CLUSTERING

被引：192

作者：

STOCKMAN, G

KOPSTEIN, S

BENETT, S

机构：

[1] MITRE CORP,DIV METREK,MCLEAN,VA 22124

[2] LNK CORP,COLL PK,MD 20740

[3] AMER MANAGEMENT SYSTEMS,ARLINGTON,VA 22209

来源：

关键词：

D O I：

10.1109/TPAMI.1982.4767240

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

引用

页码：229 / 241

页数：13

共 12 条

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[4] Duda RO, 1973, PATTERN RECOGNITION
[5] USING SYNTHETIC IMAGES TO REGISTER REAL IMAGES WITH SURFACE MODELS
HORN, BKP
BACHMAN, BL
[J]. COMMUNICATIONS OF THE ACM, 1978, 21 (11) : 914 - 924
[6] PAVLIDIS T, 1977, STRUCTURAL PATTERN R
[7] PERKINS WA, 1978, IEEE T COMPUT, V27, P126, DOI 10.1109/TC.1978.1675046
[8] PERSOON E, 1978, PHILIPS TECH REV, V30, P356
[9] SAVOL AM, 1978, MAY P IEEE C PATT RE
[10] STOCKMAN G, 1980, PB80178817