INVESTIGATION OF TAPERED MULTIPLE MICROSTRIP LINES FOR VLSI CIRCUITS

The analysis of tapered, coupled microstrip transmission lines is presented. These lines, used as interconnects between integrated circuit devices, are modeled using an iteration-perturbation approach applied in the spatial domain. From this model, a frequency-dependent scattering parameter characterization is determined. A time-domain simulation of pulse propagation through the tapered, coupled microstrip lines is performed. The frequency-domain scattering parameters are inverse Fourier transformed to obtain the time-domain Green’s function. The input pulse is convolved with the Green's function, and a Newton-Raphson algorithm is applied to account for nonlinear loads. Finally, some experimental results are shown and a simulation approximation is proposed. © 1990 IEEE