MEASUREMENT OF TRANSLATION COMPONENT AT ORDERED INTERFACES BY WEAK-BEAM ALPHA-FRINGE ELECTRON-MICROSCOPY

被引：4

作者：

MIYAZAWA, K

ISHIDA, Y

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1986年 / 142卷

关键词：

D O I：

10.1111/j.1365-2818.1986.tb02753.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：163 / 169

页数：7

共 7 条

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[5]

ISHIDA Y, 1986, PHIL MAG A

[6] STRUCTURE OF THE SIGMA=9, 11 SYMMETRICAL TILT GRAIN-BOUNDARIES IN GERMANIUM - ELECTRON-MICROSCOPY OBSERVATIONS [J].

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