Inelastic processes versus diffraction effects: Polar-angle energy-loss spectra of the graphite K edge

被引:8
作者
Gunnella, R
Davoli, I
Bernardini, R
DeCrescenzi, M
机构
[1] Dipartimento di Matematica e Fisica, Sezione Delle Istituto Nazionale di Fisica Della Materia, Università di Camerino
来源
PHYSICAL REVIEW B | 1995年 / 52卷 / 24期
关键词
D O I
10.1103/PhysRevB.52.17091
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report the angular behavior of the reflection energy-loss features above the carbon K edge in highly oriented pyrolitic graphite. The intensity variations of the pi* and sigma* structures have been used to evaluate the fine details of the basic mechanism governing the interaction between primary electrons of low kinetic energy (similar to 500 eV) and a core electron transition. We have considered the most probable scattering events, namely: single inelastic scattering, energy loss preceded by diffraction, and diffraction preceded by energy loss. In our experimental condition we have evidenced that the main channel of interaction is essentially constituted by inelastic scattering followed by diffraction processes. Our experiment resolves the degeneracy proposed by theoretical calculations that assign an equal probability to the two transitions assisted by elastic scattering. The energy-loss process does occur at a very small scattering angle from the primary beam direction (parallel-q exchanged) and this explains the capability for low-energy electrons to investigate the orientational dependence of the density of states and the bond-length direction of an adsorbed surface atom as currently done in surface x-ray-absorption measurements.
引用
收藏
页码:17091 / 17098
页数:8
相关论文
共 44 条
[1]   L AND M EDGES OF COPPER - THEORY AND EXPERIMENT [J].
AEBI, P ;
ERBUDAK, M ;
VANINI, F ;
VVEDENSKY, DD ;
KOSTORZ, G .
PHYSICAL REVIEW B, 1990, 41 (17) :11760-11769
[3]  
Bethe H. A., 1986, INTERMEDIATE QUANTUM
[5]   ELASTIC-SCATTERING AND INTERFERENCE OF BACKSCATTERED PRIMARY, AUGER AND X-RAY PHOTOELECTRONS AT HIGH KINETIC-ENERGY - PRINCIPLES AND APPLICATIONS [J].
CHAMBERS, SA .
SURFACE SCIENCE REPORTS, 1992, 16 (06) :261-331
[6]  
CHEUNG TTP, 1985, PHYS REV B, V321, P4792
[7]   X-RAY-ABSORPTION SPECTROSCOPY APPLIED TO SURFACE-STRUCTURE - SEXAFS AND NEXAFS [J].
CITRIN, PH .
SURFACE SCIENCE, 1994, 299 (1-3) :199-218
[8]  
CRESCENZI MD, 1989, PHYS REV B, V39, P8409
[9]  
DAVIS LE, 1977, HDB AUGER ELECTRON S
[10]   ANGULAR-DEPENDENCE OF THE EXFAS (EXTENDED FINE AUGER STRUCTURE) IN MGO(100) SURFACES - SHORT-RANGE ORDER VERSUS DIFFRACTION EFFECTS [J].
DAVOLI, I ;
BERNARDINI, R ;
BATTISTONI, C ;
CASTRUCCI, P ;
GUNNELLA, R ;
DECRESCENZI, M .
SURFACE SCIENCE, 1994, 306 (1-2) :144-154