HARDNESS ASSURANCE FOR SPACE SYSTEM MICROELECTRONICS

被引：12

作者：

PEASE, RL

ALEXANDER, DR

机构：

[1] Mission Research Corporation, Albuquerque, NM 87106

来源：

RADIATION PHYSICS AND CHEMISTRY | 1994年 / 43卷 / 1-2期

关键词：

D O I：

10.1016/0969-806X(94)90211-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The objective of this paper is to review hardness assurance procedures which are appropriate for modern microcircuits in space applications and to identify issues which may influence the selection of one procedure over another.

引用

页码：191 / 204

页数：14