SHEARING INTERFEROMETRY AND THE MOIRE METHOD FOR SHEAR STRAIN DETERMINATION

被引：12

作者：

PATORSKI, K

机构：

来源：

APPLIED OPTICS | 1988年 / 27卷 / 16期

关键词：

D O I：

10.1364/AO.27.003567

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3567 / 3572

页数：6

共 15 条

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[6]

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[9] ON DOUBLE-REFRACTING MICROINTERFEROMETERS WHICH SUFFER FROM A VARIABLE INTERFRINGE SPACING ACROSS THE IMAGE PLANE [J].

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JOURNAL OF MICROSCOPY-OXFORD, 1987, 146 :41-54

[10] SHEAR-STRAIN CONTOURS FROM MOIRE INTERFEROMETRY [J].

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