RESPONSE TO SELECTION IN F2 GENERATIONS OF WINTER-WHEAT FOR RESISTANCE TO HEAD BLIGHT CAUSED BY FUSARIUM-CULMORUM

被引:27
作者
SNIJDERS, CHA
机构
[1] Centre for Plant Breeding Research (CPO), Wageningen, 6700 AA
关键词
bread wheat; Fusarium culmorum; head blight; inheritance; resistance; scab; transgression; Triticum aestivum;
D O I
10.1007/BF00023641
中图分类号
S3 [农学(农艺学)];
学科分类号
0901 ;
摘要
In a field trial, F3 winter wheat lines from plants selected for Fusarium head blight resistance in F2 generations of a set of crosses, composing a 10×10 half diallel, were tested with their parental lines for resistance to Fusarium culmorum. Selection responses averaged 3.7% on the head blight percentage scale and ranged from -22.0% to 27.1%. Realized heritabilities averaged 0.23 and ranged from 0 to 0.96. Significant transgression for resistance was observed which was suggested to be genetically fixed. It was estimated that resistant parents differed in one or two resistance genes. The possibility of accumulation of resistance genes was shown. The level of head blight resistance of the parental line appeared to be a good indicator of the potential resistance level of its crosses. © 1990 Kluwer Academic Publishers.
引用
收藏
页码:163 / 169
页数:7
相关论文
共 8 条
[1]  
Mather K, 1982, BIOMETRICAL GENETICS
[2]  
Nelson PE, 1981, FUSARIUM DISEASES BI
[3]  
SCHROEDER HW, 1963, PHYTOPATHOLOGY, V53, P831
[4]   DIALLEL ANALYSIS OF RESISTANCE TO HEAD BLIGHT CAUSED BY FUSARIUM-CULMORUM IN WINTER-WHEAT [J].
SNIJDERS, CHA .
EUPHYTICA, 1990, 50 (01) :1-9
[5]   THE INHERITANCE OF RESISTANCE TO HEAD BLIGHT CAUSED BY FUSARIUM-CULMORUM IN WINTER-WHEAT [J].
SNIJDERS, CHA .
EUPHYTICA, 1990, 50 (01) :11-18
[6]  
SNIJDERS CHA, 1990, IN PRESS PHYTOPATHOL
[7]  
SNIJDERS CHA, 1990, IN PRESS THEOR APPL
[8]  
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