A STUDY OF SURFACE MODIFICATION OF SILICA USING XPS, DRIFT AND NMR

被引：52

作者：

GARBASSI, F

BALDUCCI, L

CHIURLO, P

DEIANA, L

机构：

[1] Istituto Guido Donegani, EniChem S.p.A., 28100 Novara

来源：

APPLIED SURFACE SCIENCE | 1995年 / 84卷 / 02期

关键词：

D O I：

10.1016/0169-4332(94)00469-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Silica has been treated in a slurry with several chloromethylsilanes and SiCl4. After treatment, the surfaces were characterized by XPS, DRIFT and Si-27-MAS NMR. The following reactivity scale was determined: TMCS > DCDMS > MTCS > TCS. XPS was found to be a very useful technique to complement NMR and vibrational spectroscopies, mainly from a quantitative point of view.

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页码：145 / 151

页数：7

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