X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES ON PYROLYSIS OF THIN-FILMS OF PLASMA-POLYMERIZED ACRYLONITRILE

被引：3

作者：

BHUIYAN, AH

BHORASKAR, SV

BADRINARAYANAN, S

机构：

[1] NATL CHEM LAB,POONA 411006,INDIA

[2] UNIV POONA,DEPT PHYS,POONA 411007,MAHARASHTRA,INDIA

来源：

THIN SOLID FILMS | 1994年 / 240卷 / 1-2期

关键词：

D O I：

10.1016/0040-6090(94)90695-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-Ray photoelectron spectroscopy is used to elucidate the chemical environments of the atoms in as-deposited plasma-polymerized acrylonitrile (PPAN) thin film and PPAN films pyrolysed at the temperatures 573 and 773 K. The photoelectron spectra are collected at the electron take-off angles of 20-degrees and 70-degrees. The C 1s, N 1s, and O 1s spectra of all the samples demonstrate clearly that the structural modifications take place owing to pyrolysis in the PPAN structure. Apart from the structural modifications, a decrease of nitrogen and an uptake of oxygen are evidenced. A few chemical species other than the usual ones are also detected.

引用

页码：66 / 69

页数：4

共 23 条

[1] PHOTOELECTRON-SPECTROSCOPY STUDY OF SURFACE OXIDATION OF SNTE PBTE AND PBSNTE [J].