SCANNING-TUNNELING-MICROSCOPY AND SPECTROSCOPY OF C-70 THIN-FILMS

被引：8

作者：

AIYER, HN

GOVINDARAJ, A

RAO, CNR

机构：

[1] INDIAN INST SCI, CSIR, CTR EXCELLENCE CHEM, BANGALORE 560012, KARNATAKA, INDIA

[2] INDIAN INST SCI, JAWAHARLAL NEHRU CTR ADV SCI RES, BANGALORE 560012, KARNATAKA, INDIA

来源：

BULLETIN OF MATERIALS SCIENCE | 1994年 / 17卷 / 06期

关键词：

C-70; FULLERENES; ORIENTATIONAL DISORDER; SCANNING TUNNELING MICROSCOPY; TUNNELING SPECTROSCOPY;

D O I：

10.1007/BF02757540

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Scanning tunneling microscopy of C-70 films deposited on HOPG and gold substrates has been carried but to investigate the 2D packing, defects and disorder. Besides providing direct evidence for orientational disorder, high resolution; images showing the carbon skeleton as well as the molecular arrangement in a solid solution of C-70 and C-60 are presented. Tunneling conductance measurements Indicate a small gap in the C-70 film deposited on HOPG substrate.

引用

页码：563 / 575

页数：13

共 11 条

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