SCANNING TUNNELING MICROSCOPY IMAGING OF MICROBRIDGES UNDER SCANNING ELECTRON-MICROSCOPY CONTROL

被引：10

作者：

ANDERS, M

THAER, M

MUCK, M

HEIDEN, C

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575390

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：436 / 439

页数：4

相关论文

共 13 条

[1] SURFACE MODIFICATION WITH THE SCANNING TUNNELING MICROSCOPE
ABRAHAM, DW
MAMIN, HJ
GANZ, E
CLARKE, J
[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) : 492 - 499
[2] SIMPLE MICROPOSITIONING DEVICES FOR STM
ANDERS, M
THAER, M
HEIDEN, C
[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 176 - 182
[3] AN EASILY OPERABLE SCANNING TUNNELING MICROSCOPE
BESOCKE, K
[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 145 - 153
[4] BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[5] SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY
BINNIG, G
SMITH, DPE
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) : 1688 - 1689
[6] SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE
GERBER, C
BINNIG, G
FUCHS, H
MARTI, O
ROHRER, H
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) : 221 - 224
[7] DC-SQUID OPERATION ABOVE 20-K
MUCK, M
ROGALLA, H
DAVID, B
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1985, 87 (01): : K105 - K107
[8] SCANNING TUNNELING POTENTIOMETRY
MURALT, P
POHL, DW
[J]. APPLIED PHYSICS LETTERS, 1986, 48 (08) : 514 - 516
[9] SEMICONDUCTOR INTERFACES STUDIED BY SCANNING TUNNELING MICROSCOPY AND POTENTIOMETRY
MURALT, P
[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 324 - 332
[10] POHL DW, 1986, REV SCI INSTRUM, V58, P54