CRITICAL CURRENT-DENSITY AND FLUX PINNING DETERMINED BY DIFFERENT METHODS

被引：5

作者：

ANDRA, W

BRUCHLOS, H

EICK, T

HERGT, R

MICHALKE, W

SCHUPPEL, W

STEENBECK, K

机构：

[1] Physikalisch-Technisches Institut Jena, O- 6900 Jena

来源：

PHYSICA C | 1991年 / 180卷 / 1-4期

关键词：

D O I：

10.1016/0921-4534(91)90662-I

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Three methods are applied to determine the critical current density of YBa2Cu3O7-x films: the usual transport method, the calculation from magnetization measurements and the derivation from torque measurements. The two magnetic methods operate without contacts and are suitable to investigate in detail the relaxation behaviour. They are, however, slow as compared with the transport method. Examples of the three methods applied to the same samples are presented.

引用

页码：184 / 187

页数：4

共 7 条

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